刊物
In-Process Wafer Step Height Measurement
Non-contact and non-desctructive optical measuring in the nanonmeter range. During the grinding process the wafer thickness needs to be controlled in…
Increase productivity and reduce downtime: new flexible and robust container glass thickness measurement from ic-automation and Precitec Optical Measuring
Since 2000 ic-automation GmbH has been producing special machinery. ic-automation now offers standardized flexible wall thickness measuring systems…
Inline Quality Inspection of 3D Glass for Consumer Electronics
Optical chromatic and interferometric sensors ensure fast and contactless gemoetry, thickness and cosmetic defect inspection at minimum cycle times in…
