刊物
Precitec 3D Metrology is nominated for SPIE Prism Award
SPIE announces finalists for 2023 Prism Awards
The annual awards celebrate the best of photonics innovation in areas such as biomedical devices,…
Are there any applications for which AI is not interesting?
Joachim Schwarz talks in Laser World Of Photonics about the technological potential of AI for laser-based production and quality monitoring and how…
In-Process Wafer Step Height Measurement
Non-contact and non-desctructive optical measuring in the nanonmeter range. During the grinding process the wafer thickness needs to be controlled in…
